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EFI Connect User Conference Returns to Wynn Las Vegas in 2008

30 Aug, 2007

EFI Connect User Conference Returns to Wynn Las Vegas in 2008

Foster City, CA – EFI  will hold the ninth annual Connect user
conference July 29 to August 1, 2008 at the Wynn Las Vegas. This year’s event
received trade media praise including the comment by Patrick Henry in the July
issue of American Printer that “EFI Connect is in a class by itself.”

Marc Olin, senior vice president/general manager, EFI Advanced Professional
Print Software (APPS), said: “We’re pleased to announce the date and venue for
next year’s Connect conference. Even with the focus on drupa, customers spoke
loud and clear that they also want to attend Connect, so we’re gearing up to
bring them another information-packed conference at the wonderful Wynn Las

“The time I spend at EFI Connect is critical to my business success,” said
Jim Rosenthal, vice president/COO of Digital Color Graphics and an attendee at
nearly every Connect conference. “The classes ensure that we’re using our EFI
solutions to their fullest, while giving me the opportunity to provide input
into future features and capabilities. And I always come away with a renewed
perspective on the challenges and trends facing the print industry.”

The print industry’s largest user conference, Connect enables leaders from
around the world to attend educational sessions (more than 160 of them in 2007),
test drive the latest EFI products, discuss industry trends, and network with
peers. EFI will be introducing a number of new ideas into next year’s Connect
including longer classroom sessions, more time in the computer lab, training on
upgrade releases, and some specialty “tracks” within the conference so that
clients will be able to have a focused day on a specific discipline within the
industry. In addition, EFI will be setting up a Connect focus group with prior
attendees to help us come up with other ways to ensure the conference continues
to drive value to the printing industry.

More information is available at

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